RIC3 - Radio Isotope Concentration methode

Use of device

continuous wear measurement in the range of nm/h by means of activated components in real and model systems

Basic function

the components of a tribological system are activated in a cyclotron; the wear particles produced by the tribological process are transported to a detector via a lubricant circuit attached to the tribosystem; the amount of wear is determined from the measured activity throughout the period of operation

Result of analysis

wear depth and wear volume during operation

Goal of analysis

prediction of lifetime, wear resistance of components; wear protection due to lubricant properties

Technical specification

Sample requirement

activation of components

RIC5 - Radio Isotope Concentration Methode

Use of device

continuous wear measurement in the range of nm/h by means of activated components in real and model systems

Basic function

the components of a tribological system are activated in a cyclotron; the wear particles produced by the tribological process are transported to a detector via a lubricant circuit attached to the tribosystem; the amount of wear is determined from the measured activity throughout the period of operation

Result of analysis

wear depth and wear volume during operation

Goal of analysis

prediction of lifetime, wear resistance of components; wear protection due to lubricant properties

Technical specification

Sample requirement

activation of components

LabView realtime software package

Use of device

Software framework for the development of data acquisition and control systems

Basic function

by means of a comprehensive library of device drivers and intuitive data flow programming, complex data acquisition and control tasks may be efficiently implemented

Technical specification

Windows Software in the latest version

Light scattering system

Use of device

non-contact characterisation of surfaces

Basic function

during the measurement, an LED light source projects a tight spot of light of approximately 1 mm² onto the surface; the distribution of the back-scattered light directly depends on the topography of the surface

Result of analysis

form, waviness and roughness of tribological surfaces

Goal of analysis

quality control and process monitoring for surface finishing processes

Technical specification

measuring spot diameter: 0.9 mm (0.3 mm on request); measurement speed: < 2000 m/s; insensitive to working distance (+/- 1 mm)

Sample requirement

reflectivity

high speed camera

Use of device

analysis of dynamic processes

Basic function

recording of film sequences with subsequent evaluation of trajectories, speeds, etc.

Result of analysis

motion trajectory and relative velocity

Goal of analysis

visualise short time events; capture the dynamic kinetic behaviour

Technical specification

< 33.000 frames/secondresolution: = 800x600 pixel

infrared camera

Use of device

configurable infrared camera with high thermal sensitivity and special resolution as well as maximum speed for non-contact temperature measurements; especially for fundamental research and industrial tasks

Basic function

multispectral infrared (IR) radiation analysis (short wave or long wave IR region) of the test object

Result of analysis

high speed thermal imaging video

Goal of analysis

heat disspation and propagation in tribological contacts

Technical specification

temperature range: 0 - 2500 °C; recording speed (full frame): < 100 frames/second

Sample requirement

working distance: > 14 cm; lateral frame size: 2 x 2.5 cm (up to infinite)

Acoustic emission measurement system

Use of device

measurement of the acoustic emission from tribological systems; highly sensitive detection of microcracks, microstructural changes and other friction-induced effects

Basic function

piezoelectric

Result of analysis

local high-frequency vibrations in tribocontacts; friction; detection of crack formation; particle breakouts and micro-structural changes

Goal of analysis

condition monitoring; investigation of "hard-to-watch" tribocontacts; assessment of coatings

Technical specification

frequency range: 20 kHz - 3 MHz; flat frequency response; sensitivity: 10 - 100 V/(m/s)

Sample requirement

> 0.25 cm² flat surface on specimen or specimen holder

Free-field microphone system

Use of device

noise emission measurement during tribological experiments

Basic function

capacitive

Result of analysis

noise emission of tribological systems; vibrations of tribological systems

Goal of analysis

optimisation of tribological systems with regard to noise emissions

Technical specification

sensitivity: 50 mV/Pa; frequency: 6.3 Hz - 20 kHz; dynamic range: 14.6 - 146 dB

System of confocal chromatic sensors

Use of device

measurement of displacement, position, thickness

Basic function

with the confocal chromatic measurement method white light is split into different spectra by lenses and focused on an object through a multi-lens optical system; the optics are arranged in such a way, that the light is refracted via controlled chromatic aberrations into displacement-dependant monochromatic wavelengths

Result of analysis

displacement, position, thickness

Goal of analysis

wear height measurements; film thickness measurement

Technical specification

measuring ranges: 0.12 - 24 mm; linearity < 0.12 µm; resolution < 0.005 µm; extremely small and constant spot size; high precision measurement, including mirrors and glass; nanometre resolution; one-sided thickness-measurement; detection of smallest micro-cracks

Sample requirement

reflectivity

Particle sizing

Use of device

determination of the size of metallic particles in lubricants, aqueous solutions, and emulsions

Basic function

detection of particles by dark field visualization and sizing based on tracking of Brownian motion

Result of analysis

particle load in liquid samples; amount of wear in lubricants; aggregation/sedimentation behaviour; emulsion stability

Goal of analysis

measuring the particle size/concentration in liquid samples, e.g. wear particles in engine oil or metal working fluids

Technical specification

detection range: approx. 100 nm - 5 µm for most metal particles; > 300 nm for weakly scattering materials (polymers, biological species)

Sample requirement

liquid sample of known temperature dependant viscosity; sample amount typically 0.1-1 mL

Single-axis model switch

Use of device

investigation on switching behaviour under variation of kinetic parameters and contact materials

Basic function

measurement of contact force, contact position (dynamic) and contact voltage

Result of analysis

contact welding, material transfer, contact voltage, contact material

Goal of analysis

information on the influence of certain kinetic parameters on contact welding behaviour, contact voltage and material transfer behaviour

Technical specification

bis zu 50 VDC

Sample requirement

rivets, piston diameter 1.5 mm

Single-axis model switch

Use of device

investigation on switching behaviour under variation of kinetic parameters and contact materials

Basic function

measurement of contact force, contact position (dynamic) and contact voltage

Result of analysis

contact welding, material transfer, contact voltage, contact material

Goal of analysis

information on the influence of certain kinetic parameters on contact welding behaviour, contact voltage and material transfer behaviour

Technical specification

230 VAC or < 60 VDC, inrush current about 100 A

Sample requirement

rivets, piston diameter 1.5 mm

Test rig for investigations of the contact tolerance of organic vapours

Use of device

investigation of outgassing products of plastics, life-time test of signal relays

Basic function

measurement of the contact voltage via transient recorder

Result of analysis

contact compatibility and reliability of plastics

Goal of analysis

investigation of application possibilities of plastics for relay housings

Technical specification

4 relays parallel; 1 microsecond per channel

Sample requirement

granulate

Pendulum-Scratcher

Use of device

Producing micrometer scratches (amongst others to produce short acoustic emissions)

Basic function

At an oscillating pandulum with a length of 1 m, a tip (e.g. a insert tip) can be mounted at the end, whitch creates, at the low mark of the oszillation, a scratch on the sample

Result of analysis

Measurement of the acoustic emissions, unadulterated of reflexions, of modelled tribologic single-events (scratches)

Goal of analysis

Recording oft the originally acoutic emissions of modelled tribologic events

Technical specification

Sample requirement

sheets with thin, upright edge

High Frequency Measurement System

Use of device

Machine learning can be seen as main field of application, whereat amongst others acoustic emissions emanating from tribologic constacts are measured (structure-borne noise measurement) and handled online; basically it could be used for every analogue voltage measurement at the specified voltage - and frequency range, respectively

Result of analysis

Machine Learning: Identification of wear type, Prediction of end of lifetime

Technical specification

PC: Betriebssystem: Windows 10Processor: XEONRAM: 64 GBMeasurement Card:-) 4 simultaneous analog input channels-) 16-bit resolution A/D converter-) 125 MS/s maximum sampling rate-) 4-Order 20MHz filter-) 2 GB onboard storage memory-) Auto calibration

3D Structured Light Scanner

Use of device

Computer-controlled 3D measuring system with automatic turntable.

Basic function

Detection of three-dimensional objects using combined stereo vision technology and strip light illumination.

Goal of analysis

The structured-light-scanner captures the dimensions of an object and creates a digitized 360° 3D model.

Technical specification

Scansize: 60-500 mm (can be extended with bigger calibration panels)Resolution/Accuracy: 0,05% of the scan width (up to 0,05 mm)Scan Time: Single-Scan within 2 seconds (up to 10 sec depending on settings and pc performance)Mesh Density: 2.300.000 knots per scanExport Formats: OBJ, STL, PLY

Sample requirement

There could be difficulties with reflective surfaces.

PXIe-1095

Use of device

Sensing devices, instruments, data processing, data acquisition, data analysis, real time controlling.

Basic function

PXI systems provide high-performance modular instruments and other I/O modules that feature specialized synchronization and key software features for test and measurement applications from device validation to automated production test.

Result of analysis

The PXI system consitutes a flexible platform to customise sensing and controlling platform for a variety of applications. The various slots allows to customise the system to allow for real time device controlling, sensing and acquisition of signals in a wide range of frequencies and power.

Goal of analysis

-Control of ultrasonic and acoustic sensing devices-Control of customised sensors-real time triggering and data acquisition

Technical specification

PXI Express, PXI chassis, 18 slots (5x hybrid, 11x PXI Express, 1x PXI Express system timing), max. 24 GB / sPXIe-5110 PXI Oscilloscope with CableSenseTechnology, 100 MHz, 8 bits, 1 GS/s, 2Channels, 64 MBPXIe-8840 Quad Core, Windows 10 64-bitPXIe-5451 PXI Waveform Generator, 145 MHz,16 bits, 400 MS/s, 2 Channels, 512 MB

Sample requirement

N/A