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Dual core confocal and interferometric microscope

Use of device

non-contact 3D-charactarisation of surfaces, wear volume and roughness parameters

Basic function

confocal: for each measurement position the measuring head vertically scans the sample and records the confocal intensity as a function of scan position; from the matrix of vertical sections a 3-dimensional image of the surface is created; interferometric: Mirau-type lenses feature an internal mirror for splitting up the primary beam through superposition of primary and secondary beam, an interference signal is created as a function of the point-wise surface height

Result of analysis

statistical surface parameters, e.g., roughness, profile, waviness, wear volume 2- and-3 dimensional visualisation of the data

Goal of analysis

analyses of technical surfaces with accuracy in the micrometre range

Technical specification

confocal objectives: 10x (1270x950 µm), 20x (636x477 µm), 50x (254x190 µm), 100x (127x95 µm); interferometric objectives type Mirau: 10x, 50x; stitching available, vertical resolution down to single-digit nanometre-range

Sample requirement



Contact

Brandtner, Daniel




Focus variation microscope

Use of device

non-contact 3D-charactarisation of surfaces, wear volume and roughness parameters

Basic function

for each pixel a sharpness value is calculated via a comparison of the contrast with its nearest neighbours; the measuring head vertically scans the sample and records the pixel-sharpness as a function of scan position; from the location of the maxima a three dimensional image of the surface is created

Result of analysis

statistical surface parameters, e.g., standardised roughness parameters, waviness, wear volume and 2- and 3- dimensional visualisation of the data

Goal of analysis

analyses of technical surfaces with accuracy in the micrometre range

Technical specification

lenses: 5x (2.82x2.82 mm), 10x (1.62x1.62 mm); stitching possible; low measurement times (flat surface: 5 cm² within approx. 15 min); vertical resolution in the high nanometre range

Sample requirement

non-transparent roughness: Ra > 500 nm; specimen dimensions: < 200x200x200 mm; weight: < 30 kg



Contact

Brandtner, Daniel




3D profilometer (confocal chromatic sensor)

Use of device

non-contact 3D-charactarisation of surfaces and roughness parameters; portable and useable in industrial surroundings

Basic function

white light is split by a group of lenses into different spectra and sent on the sample; depending on the distance of the lenses to the sample one spectrum is in focal distance (use of chromatic aberration); the sensor measures the spectra and calculates the sample distance by using the maximum of the wavelength dependant intensity distribution; by line wise and column wise scanning of the sample, a three dimensional image of the surface is created

Result of analysis

statistical surface parameters, e.g., standardised roughness parameters, waviness, wear volume and 2- and 3- dimensional visualisation of the data

Goal of analysis

analyses of technical surfaces with accuracy in the nanometre range; measuring of the thickness of a transparent layer

Technical specification

sensors: OP1 (measuring range: 3.0 mm, vertical resolution: 40 nm) and OP2 (measuring range: 300 µm, vertical resolution: 5.7 nm); weight: 5.5 kg; dimensions: 20x30x17 cm³; xy-travel range: 25 mm

Sample requirement

reflectivity



Contact

Tomastik, Christian DI




Incident light microscope

Use of device

microscopic investigation of test samples (25x - 1000x magnification)

Basic function

optical microscope with digital imaging and xyz-table

Result of analysis

display of 2-dimensional structures such as coatings and microstructure

Goal of analysis

characterisation of material and material structure; analysis of wear zone (topography- and phase-dissolved) as well as microstructure; documentation of cracks and pores

Technical specification

magnification: 25 - 1000x; dark- and bright-field; polarisation filter; interference filter; motorised xyz-table

Sample requirement

high: < 6 cm; flat surface or embedded; weight: < 500 g



Contact

Premauer, Markus




Stereo microscope

Use of device

three dimensional visualization of the sample

Basic function

optical microscope with digital imaging

Result of analysis

display of three-dimensional structures such as worn surfaces of components and fracture surfaces

Goal of analysis

identification of surface defects, cracks, origin of fracture; first evaluation of wear tracks

Technical specification

magnification 7 - 115x

Sample requirement

wide range of working distance enables large variety of sample sizes and sample geometries



Contact

Premauer, Markus




Tribo-/Nanoindenter

Use of device

instrumented analysis of mechanical properties at small loads

Basic function

hardness, elastic modulus and viscoelastic properties can be determined at minimum load [µN - mN]; scratch testing, friction measurements, SPM

Result of analysis

mechanical properties like hardness, elastic modulus, stiffness, friction and wear behaviour, viscoelastic properties

Goal of analysis

mechanical characterisation of materials, precipitations and (thin) layers

Technical specification

test load: 1 µN - 10 mN; vertical resolution < 1 nm; lateral resolution SPM: 100 nm

Sample requirement

to be discussed



Contact

Tomastik, Christian DI




Scratch-tester

Use of device

investigation on coating adhesion and coating fatigue; grooving behaviour of materials

Basic function

an indenter is moved over a surface under loading, scratch forces and acoustic emissions are measured and correlated with wear behaviour

Result of analysis

determination of coating adhesion and fatigue; ploughing and scratch behaviour of materials; determination of critical scratch energies

Goal of analysis

characterisation of surface against scratch; determination of coating adhesion

Technical specification

normal load: 10 - 100 N; variable velocities: 1 mm/s - 50 mm/s; flexible loading ramps; reversible scratches for fatigue testing are possible; Rockwell indenter: 50 µm - 200 µm; steel ball indenter: 1.587 mm

Sample requirement

specimen dimensions: < 40x100 mm; height: < 15 mm; testing surface plane parallel and fine ground or polished



Contact

Premauer, Markus




High Temperature Hardness and Scratch Test Rig

Use of device

measurement of hardness (HV, HB) and performing scratch tests up to 1000 °C; hardness measurement at the temperature of application

Basic function

hardness test according Vickers with 2 - 50 kg normal load; scratch test at 10 - 500 N normal load; sliding velocity between 1mm/min - 10 mm/s; exchanegable indenters; user specific material combinations are possible; sample heating up to 1000 °C; automated measurement of hardness-temperature curves or series of scratches

Result of analysis

hardness at applications temperature of the material as a parameter for wear properties; scratch tests give an information on the wear resistance under specific loading conditions (load/velocity/temperature)

Goal of analysis

hardness and scratch detection; determination of critical application temperatures and mechanical stress parameters of a material

Technical specification

high temperature testing under vacuum; test temperature: RT - 1000 °C; test load: 10 - 500 N; sliding velocity: 1 mm/min - 10 mm/s; atmosphere: ambient, vacuum (5 mbar)

Sample requirement

specimen dimensions: 68 x 30 x10 mm plane parallel; surface polished (hardness measurements); ground (scratch tests)



Contact

Varga, Markus




Cut-off machine 2

Use of device

coarse cutting of large components

Basic function

Result of analysis

Goal of analysis

preparation of specimens

Technical specification

Sample requirement



Contact

Premauer, Markus
Tschirk, Werner Ing.




Micro hardness tester

Use of device

measurement of micro-hardness with 1 - 1000 g test load

Basic function

Vickers hardness test

Result of analysis

hardness determination of specific microstructure components, hardness profile

Goal of analysis

hardness detection (major mechanical material parameter influencing the tribological behaviour)

Technical specification

test load: 1 - 1000 g

Sample requirement

surface must be plane and polished



Contact

Premauer, Markus




Macro hardness tester

Use of device

measurement of hardness with 1 - 50 kg test load

Basic function

Vickers, Brinell or Rockwell hardness test

Result of analysis

hardness as parameter of how resistant solid matter is to various kinds of permanent shape change when a force is applied

Goal of analysis

hardness detection (major mechanical material parameter influencing the tribological behaviour)

Technical specification

test load: 1 - 50 kg

Sample requirement

surface must be plane and ground to a fine finish



Contact

Premauer, Markus




Grinding and polishing machine

Use of device

materialographic sample preparation

Basic function

the samples can be ground with grain sizes of 80 to 4000 and subsequently polished with polishing cloths to different levels form 12 µm to 0.25 µm

Result of analysis

Goal of analysis

preparation of specimens

Technical specification

fully automatic and manual sample preparation

Sample requirement



Contact

Premauer, Markus
Tschirk, Werner Ing.




Cutting machine 3

Use of device

materialographic sample preparation

Basic function

accurate cuts are possible with a blade thickness of 1.5mmserial cuts up to 100mm are possible with a automatic x-table

Result of analysis

Goal of analysis

preparation of specimens

Technical specification

rotation speed: 1500-3000rpm

Sample requirement

specimen dimensions: <500x200x100mm, max ø119mm



Contact

Premauer, Markus




Hot mounting press

Use of device

materialographic sample preparation

Basic function

the samples are placed in a cylinder which is then filled with plastic granules which are melted under pressure at 80-180 °C

Result of analysis

Goal of analysis

preparation of specimens

Technical specification

specimen diameter: 25 mm or 40 mm

Sample requirement



Contact

Premauer, Markus
Tschirk, Werner Ing.




Scanning electron microscope

Use of device

Scanning electron microscopy SEMEnergy dispersive X-ray spectra EDSElectron backscatter diffraction EBSD

Basic function

Electrons are accelerated on the samples surface utilising a tungsten cathode and interact with the material. Depending on the detectors, either the surface topography (secondary electrons) or the materials contrast (backscatter electrons) can be visualised.The created X-rays can be measured via energy dispersive X-ray spectroscopy and quantifies the samples chemical composition.Backscatter diffraction electrons can be detected in form of diffraction patterns, which indicates the crystallographic habit of present materials phases and their deformation state.

Result of analysis

Detection and quantifiaction of surfaces regarding their chemical compositions and/or their surface condiions, e.g. wear characterisation, tribolayer formation, fracture surface analysis, etc.Quantification of tribologically induced deformations and materials changes in metallographical cross sections via EBSD.

Goal of analysis

High resolution microscopy for enhanced samples analysis (SEM)Detection of the chemical composition of samples (EDS)Clarification of type, distribution, composition and state of materials phases (EBSD)

Technical specification

Tungsten filament, fully automatic gun alignementAcceleration voltage 0.3 - 30 kVProbe current 1 pA - 1 µAVacuum conditions 10 - 650 Pa

Sample requirement

Max. sample specs ø200mm



Contact

Premauer, Markus
Rojacz, Harald




Precision cut-off machine 1

Use of device

materialographic sample preparation

Basic function

accurate cuts are possible with a blade thickness of 0.8 mm

Result of analysis

Goal of analysis

preparation of specimens

Technical specification

rotational speed: 300 - 5000 rpm

Sample requirement

specimen dimensions: 150x100x70 mm, maximal weight: 5 kg



Contact

Premauer, Markus
Tschirk, Werner Ing.